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Electrical transport model of Silicene as a channel of field effect transistor.

Journal of nanoscience and nanotechnology (2014-04-18)
Hatef Sadeghi
ZUSAMMENFASSUNG

The analytical electrical transport model of the Silicene, a single layer of sp3 bonded silicon atoms in the honeycomb lattice structure as a channel in the field effect transistor configuration is presented in this paper. Although the carrier concentration of the Silicene shows similar behavior to Graphene, there are some differences in the conductance behavior. Presented model shows increment in the total carrier and the conductance with the gate voltage as expected for conventional semiconductors which affected by the temperature only in the neutrality point. The minimum conductance is increased by the temperature whereas it remains stable in the degenerate regime. Presented analytical model is in good agreement with the numerical conductance calculation based on the implementation of the non-equilibrium Green's function method coupled to the density functional theory.

MATERIALIEN
Produktnummer
Marke
Produktbeschreibung

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Graphit, powder, <20 μm, synthetic
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Silizium, powder, −325 mesh, 99% trace metals basis
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Silizium, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm
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Graphit, flakes
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Silizium, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm
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Silizium, nanopowder, <100 nm particle size (TEM), ≥98% trace metals basis
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Graphit, powder, <45 μm, ≥99.99% trace metals basis
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Silizium, wafer (single side polished), <100>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm
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Graphit, rod, L 150 mm, diam. 3 mm, low density, 99.995% trace metals basis
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Graphit, powder, <150 μm, 99.99% trace metals basis
Sigma-Aldrich
Silizium, wafer (single side polished), <100>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.5 mm
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Silizium, pieces, 99.95% trace metals basis
Sigma-Aldrich
Silizium, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm
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Silizium, wafer (single side polished), <111>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm
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Graphit, rod, L 150 mm, diam. 6 mm, 99.995% trace metals basis
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Silizium, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 3 in. × 0.5 mm
Sigma-Aldrich
Silizium, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm
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Silizium, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm
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Silizium, wafer, <111>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.3 mm
Sigma-Aldrich
Silizium, wafer (single side polished), <111>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm
Silizium, sheet, 10x10mm, thickness 0.5mm, single crystal, -100, 100%
Silikon, rod, 100mm, diameter 12.7mm, single crystal - random orientation, 100%
Silikon, sheet, 10x10mm, thickness 0.6mm, single crystal, -100, 100%
Silikon, disks, 15.9mm, thickness 0.38mm, single crystal, n-type, 100%
Silikon, disks, 15.9mm, thickness 0.38mm, single crystal, n-type, 100%
Silikon, rod, 50mm, diameter 2.0mm, crystalline, 100%
Silikon, sheet, 52x52mm, thickness 1.0mm, polycrystalline, 99.999%
Silizium, sheet, 40x40mm, thickness 3.0mm, single crystal, p-type, 100%
Silikon, rod, 80mm, diameter 20mm, single crystal, -100, 99.999%
Silikon, sheet, 25x25mm, thickness 1.0mm, polycrystalline, 99.999%