Achromatic elemental mapping beyond the nanoscale in the transmission electron microscope.

Achromatic elemental mapping beyond the nanoscale in the transmission electron microscope.

Physical review letters (2013-05-21)

K W Urban, J Mayer, J R Jinschek, M J Neish, N R Lugg, L J Allen

ZUSAMMENFASSUNG

Newly developed achromatic electron optics allows the use of wide energy windows and makes feasible energy-filtered transmission electron microscopy (EFTEM) at atomic resolution. In this Letter we present EFTEM images formed using electrons that have undergone a silicon L(2,3) core-shell energy loss, exhibiting a resolution in EFTEM of 1.35 Å. This permits elemental mapping beyond the nanoscale provided that quantum mechanical calculations from first principles are done in tandem with the experiment to understand the physical information encoded in the images.

MATERIALIEN

Produktnummer

Marke

Produktbeschreibung

215619

Sigma-Aldrich

Silizium, powder, −325 mesh, 99% trace metals basis

646687

Sigma-Aldrich

Silizium, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm

647101

Sigma-Aldrich

Silizium, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 2 in. × 0.5 mm

633097

Sigma-Aldrich

Silizium, nanopowder, <100 nm particle size (TEM), ≥98% trace metals basis

647764

Sigma-Aldrich

Silizium, wafer (single side polished), <100>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm

647675

Sigma-Aldrich

Silizium, wafer (single side polished), <100>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.5 mm

343250

Sigma-Aldrich

Silizium, pieces, 99.95% trace metals basis

647799

Sigma-Aldrich

Silizium, wafer (single side polished), <111>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm

647535

Sigma-Aldrich

Silizium, wafer (single side polished), <100>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm

647780

Sigma-Aldrich

Silizium, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 2 in. × 0.5 mm

647802

Sigma-Aldrich

Silizium, wafer (single side polished), <100>, N-type, contains phosphorus as dopant, diam. × thickness 3 in. × 0.5 mm

647543

Sigma-Aldrich

Silizium, wafer (single side polished), <111>, N-type, contains no dopant, diam. × thickness 3 in. × 0.5 mm

647705

Sigma-Aldrich

Silizium, wafer, <111>, P-type, contains boron as dopant, diam. × thickness 2 in. × 0.3 mm

647772

Sigma-Aldrich

Silizium, wafer (single side polished), <111>, P-type, contains boron as dopant, diam. × thickness 3 in. × 0.5 mm