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Merck

725471

Sigma-Aldrich

双(甲基-η5-环戊二烯)甲氧基甲基锆

packaged for use in deposition systems

别名:

ZRCMMM, ZrD-CO4

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About This Item

线性分子式:
Zr(CH3C5H4)2CH3OCH3
分子量:
295.53
MDL號碼:
分類程式碼代碼:
12352103
PubChem物質ID:
NACRES:
NA.23

形狀

liquid

反應適用性

core: zirconium

顏色

colorless

bp

110 °C/0.5 mmHg (lit.)

密度

1.27 g/mL±0.01 g/mL at 25 °C (lit.)

SMILES 字串

C[C]1[C][C][C][C]1.C[C]2[C][C][C][C]2.C[Zr]OC

InChI

1S/2C6H7.CH3O.CH3.Zr/c2*1-6-4-2-3-5-6;1-2;;/h2*2-5H,1H3;1H3;1H3;/q;;-1;;+1

InChI 密鑰

LFGIFPGCOXPKMG-UHFFFAOYSA-N

一般說明

Atomic number of base material: 40 Zirconium

應用

Advanced precursor for atomic layer deposition of ZrO2 thin films. Hafnium and zirconium oxides are leading candidates to replace silicion dioxide as the gate oxide in a variety of semiconductor and energy applications. Excellent properties of HfO2 and ZrO2 films make them especially attractive for gate oxide replacement and as potential insulating dielectrics for capacitive elements in memory devices such as DRAM.

特點和優勢

Compatible with a variety of oxidants in ALD growth processes across a wide temperature range exhibiting self limiting growth up to 400 °C. Precursor volatility and thermal stability properties enable easy materials transport from bubblers into conventional deposition tools.

包裝

Packaged in stainless steel cylinders compatible with conventional deposition systems. Precursors may be used in liquid injection systems as dilute solutions and in combination with a variety of other sources to deposit mixed oxides.

象形圖

Exclamation mark

訊號詞

Warning

危險聲明

防範說明

危險分類

Acute Tox. 4 Oral - Eye Irrit. 2 - Skin Irrit. 2

儲存類別代碼

10 - Combustible liquids not in Storage Class 3

水污染物質分類(WGK)

WGK 3

閃點(°F)

226.4 °F

閃點(°C)

108 °C


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其他客户在看

J. W. Elama
Applied Physics Letters, 91, 253123-253123 (2007)
Gutsche, M.; Seidl, H.; Luetzen J.; Birner, A.;
International Electron Devices Meeting, 18-18 (2001)
High-k gate dielectrics: current status and material properties considerations
Wilk, G.D.; Wallace, R.M.; Anthony, J.M.
Journal of Applied Physics, 89, 5243-5243 (2001)

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