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Merck

116068

Sigma-Aldrich

N-羟乙基哌啶

ReagentPlus®, 99%

别名:

1-哌啶乙醇, N-哌啶乙醇

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About This Item

经验公式(希尔记法):
C7H15NO
CAS号:
分子量:
129.20
Beilstein:
103390
EC號碼:
MDL號碼:
分類程式碼代碼:
12352100
PubChem物質ID:
NACRES:
NA.22

產品線

ReagentPlus®

化驗

99%

折射率

n20/D 1.4804 (lit.)

bp

199-202 °C (lit.)

密度

0.973 g/mL at 25 °C (lit.)

SMILES 字串

OCCN1CCCCC1

InChI

1S/C7H15NO/c9-7-6-8-4-2-1-3-5-8/h9H,1-7H2

InChI 密鑰

KZTWONRVIPPDKH-UHFFFAOYSA-N

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應用

1-(2-Hydroxyethyl)piperidine (1-Piperidineethanol) has been used as the base quencher to determine the efficiency of the decomposition of photoacid generators.
Counter-ion used for investigations of skin permeation of flurbiprofen

Catalyst used for enantioselective synthesis

Amine quencher used during synthesis of photoacid generators for ArF lithography

Adsorbent for capture and release of pressurized carbon dioxide for greenhouse gas control

法律資訊

ReagentPlus is a registered trademark of Merck KGaA, Darmstadt, Germany

象形圖

Exclamation mark

訊號詞

Warning

危險聲明

防範說明

危險分類

Acute Tox. 4 Oral

儲存類別代碼

10 - Combustible liquids

水污染物質分類(WGK)

WGK 3

閃點(°F)

156.2 °F - closed cup

閃點(°C)

69 °C - closed cup

個人防護裝備

Eyeshields, Faceshields, Gloves, type ABEK (EN14387) respirator filter


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Xu Ma et al.
Journal of pharmaceutical sciences, 99(4), 1826-1837 (2009-11-07)
The aim of this work was to investigate the percutaneous absorption of flurbiprofen (FP) using counter-ions as enhancers as well as to compare their enhancing activity with penetration enhancers in vitro. The in vitro permeation studies of FP were performed
T. Asakura, et al
J. Photopolym. Sci. Technol., 18, 407-414 (2005)
François Lutz et al.
Journal of the American Chemical Society, 127(35), 12206-12207 (2005-09-01)
An asymmetric autocatalytic reaction has been catalyzed by a mixture of chiral and achiral beta-amino alcohols. The absolute configuration of the highly enantioenriched obtained product (>98% ee) was shown to depend not only on the absolute configuration of the chiral
K. Tomizaki, et al.,
Chemistry Letters (Jpn), 37, 516-517 (2008)
A standard addition technique to quantify photoacid generation in chemically amplified photoresist.
Chemistry of Materials, 13(11), 4154-4162 (2001)

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