NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• UNSPSC Code: 41116107
• NACRES: NA.24

Properties

• grade: certified reference material
• Quality Level: 100
• form: solid
• packaging: pkg of 1 block
• manufacturer/tradename: NIST^®
• technique(s): diffraction/scattering: suitable
• application(s): general analytical

Description

General description

This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with International System of Units (SI) [1] traceable Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection for our reference wavelength. A unit of SRM 2000 consists of25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.

SRM 2000_cert

SRM 2000_SDS

Other Notes

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

Legal Information

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

Safety Information

• Storage Class Code: 10 - Combustible liquids
• WGK: WGK 3
• Flash Point(F): Not applicable
• Flash Point(C): Not applicable