NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• NACRES: NA.24
• UNSPSC Code: 41116107

Właściwości

• grade: certified reference material
• Quality Segment: 100
• form: solid
• packaging: pkg of 1 block
• manufacturer/tradename: NIST^®
• technique(s): diffraction/scattering: suitable
• application(s): general analytical

Opis

General description

Each unit of Standard Reference Material (SRM) contains 25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. For more information, please refer to the SDS and COA.


SRM 2000_cert

SRM 2000_SDS

Application

This Standard Reference Material (SRM) offers the high-resolution X-ray diffraction (HRXRD) community SI-traceable Si (220) d-spacing in transmission, wafer miscut angle relative to the crystal plane, and the surface-to-Si (004) Bragg angle in reflection for the specified reference wavelength.

Features and Benefits

Certified values for SRM 2000 are available and can be used to calibrate HRXRD instrumentation. Expiration details, along with instructions for use, are included on the NIST certificate.

Other Notes

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

Legal Information

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

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Informacja o środkach bezpieczeństwa

• Klasa składowania: 11 - Combustible Solids
• wgk: nwg
• flash_point_f: Not applicable
• flash_point_c: Not applicable