Characterization of pyramidal inversion boundaries in Sb2O3-doped ZnO by using electron back-scattered diffraction (EBSD).

Characterization of pyramidal inversion boundaries in Sb2O3-doped ZnO by using electron back-scattered diffraction (EBSD).

Acta crystallographica. Section A, Foundations of crystallography (2007-04-17)

Wook Jo, Chan Park, Doh-Yeon Kim

ANOTACE

The composition planes of the inversion boundary induced by the addition of Sb2O3 to ZnO ceramics were analyzed crystallographically by the application of electron back-scattered diffraction (EBSD) analysis and stereographic projection techniques. The inversion boundary was determined to consist of three discrete composition planes, {0001}, {1011}, {1010}.

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