US EPA Method 525.2: GC Analysis of Semivolatiles on SLB^®-5ms, Fast GC Analysis

column

SLB-5ms, 20 m × 0.18 mm I.D., 0.18 μm (28564-U)

oven

45 °C, 86 °C/min to 130 °C (1.73 min), 20 °C/min to 180 °C, 12 °C/min to 240 °C, 20 °C/min to 330 °C (2 min)

inj. temp.

275 °C

MSD interface

330 °C

scan range

m/z = 40-450

carrier gas

helium, 1.4 mL/min, constant

injection

1 μL splitless (0.75 min)

liner

2 mm I.D. fast FocusLiner^™ liner with taper

sample

109 component semivolatile standard (each analyte at 2 ppm), plus 3 surrogate and 3 internal standard compounds (each at 5 ppm) in ethyl acetate