US EPA Method 8270: GC Analysis of Semivolatiles on SLB^®-5ms (20 m x 0.18 mm I.D., 0.36 μm), Fast GC Analysis

column

SLB-5ms, 20 m x 0.18 mm I.D., 0.36 μm (28576-U)

oven

40 °C (1 min), 12 °C/min to 200 °C, 20 °C/min to 340 °C (2 min)

inj. temp.

250 °C

MSD interface

340 °C

scan range

m/z 40-450

carrier gas

helium, programmed flow; 0.5 mL/min (5 min hold), to 1 mL/min at 5.5 min (constant for remainder of run)

injection

0.50 μl, pulsed splitless (25 psi until 0.1 min) (0.75 min)

liner

4 mm I.D., single taper

sample

80 component semivolatile standard at 50 ppm plus 6 internal standards (at 40 ppm) in methylene chloride