US EPA Method 8270: GC Analysis of Semivolatiles on SLB^®-5ms (20 m x 0.18 mm I.D., 0.18 μm), Fast GC Analysis

column

SLB-5ms, 20 m x 0.18 mm I.D., 0.18 μm (28564-U)

oven

40 °C (0.7 min), 55 °C/min to 240 °C, 28 °C/min to 330 °C (2 min)

inj. temp.

250 °C

MSD interface

330 °C

scan range

m/z = 40-450

carrier gas

helium, 40 cm/sec, constant

injection

0.5 μL, 10:1 split

liner

2 mm I.D., fast FocusLiner^™ liner with taper (2879501-U)

sample

80 component semivolatile standard at 50 ppm plus 6 internal standards (at 40 ppm) in methylene chloride