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NIST2012

Calibration standard for high-resolution X-ray diffraction

NIST® SRM® 2012, 200 mm wafer

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About This Item

UNSPSC Code:
41116107
NACRES:
NA.24

grade

certified reference material

packaging

pkg of wafer

manufacturer/tradename

NIST®

application(s)

pharmaceutical (small molecule)

General description

This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection traceable to the International System of Units (SI) [1] for our reference wavelength. A unit of SRM 2012
consists of a 200 mm diameter × 0.725 mm thick double-polished (100)-oriented, single-crystal Si wafer with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.

SRM 2012_cert SRM 2012 _SDS

Legal Information

NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology

Storage Class

11 - Combustible Solids

wgk_germany

WGK 3

flash_point_f

Not applicable

flash_point_c

Not applicable


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