NIST2012
Calibration standard for high-resolution X-ray diffraction
NIST® SRM® 2012, 200 mm wafer
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About This Item
UNSPSC Code:
41116107
NACRES:
NA.24
grade
certified reference material
packaging
pkg of wafer
manufacturer/tradename
NIST®
application(s)
pharmaceutical (small molecule)
General description
This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection traceable to the International System of Units (SI) [1] for our reference wavelength. A unit of SRM 2012
consists of a 200 mm diameter × 0.725 mm thick double-polished (100)-oriented, single-crystal Si wafer with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.
SRM 2012_cert SRM 2012 _SDS
consists of a 200 mm diameter × 0.725 mm thick double-polished (100)-oriented, single-crystal Si wafer with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.
SRM 2012_cert SRM 2012 _SDS
Legal Information
NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology
Storage Class
11 - Combustible Solids
wgk_germany
WGK 3
flash_point_f
Not applicable
flash_point_c
Not applicable
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Certificates of Analysis (COA)
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