16259
Silicon Standard for AAS
TraceCERT®, 1 g/L Si in NaOH (nominal concentration)
Synonym(s):
Silicon AAS Standard Solution
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About This Item
Recommended Products
grade
certified reference material
TraceCERT®
Quality Level
product line
TraceCERT®
concentration
1 g/L Si in NaOH (nominal concentration)
technique(s)
AAS: suitable
application(s)
industrial qc
pharmaceutical
format
single component solution
General description
This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty and expiry date.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty and expiry date.
Application
Silicon standard may be used as calibration standard during determination of silicon from powdered aluminium oxide and petrochemical products using graphite-furnace atomic-absorption spectrometry (GF-AAS).
Analysis Note
1 g/L Si in 2% sodium hydroxide, prepared with high purity silicon metal, NaOH and water
Other Notes
For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website
Legal Information
TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany
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Danger
hcodes
Hazard Classifications
Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B
Storage Class
8B - Non-combustible corrosive hazardous materials
wgk_germany
WGK 1
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter
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Fresenius' journal of analytical chemistry, 370(7), 855-859 (2001-09-25)
A direct method for determination of silicon in powdered high-purity aluminium oxide samples, by slurry sampling with in situ fusion graphite-furnace atomic-absorption spectrometry (GF-AAS), has been established. A slurry sample was prepared by 10-min ultrasonication of a powdered sample in
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