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634395

Sigma-Aldrich

Zirconium(IV) silicate

nanopowder, <100 nm particle size (BET), 98.5% trace metals basis

Synonym(s):

Zirconium(IV) silicon oxide

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About This Item

Linear Formula:
ZrSiO4
CAS Number:
Molecular Weight:
183.31
EC Number:
MDL number:
UNSPSC Code:
12352302
PubChem Substance ID:

assay

98.5% trace metals basis

form

nanopowder

particle size

<100 nm (BET)

SMILES string

[Zr+4].[O-][Si]([O-])([O-])[O-]

InChI

1S/O4Si.Zr/c1-5(2,3)4;/q-4;+4

InChI key

GFQYVLUOOAAOGM-UHFFFAOYSA-N

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Features and Benefits

Often cited as a potential alternative gate dielectric to silica.

Storage Class

11 - Combustible Solids

wgk_germany

WGK 3

flash_point_f

Not applicable

flash_point_c

Not applicable

ppe

dust mask type N95 (US), Eyeshields, Gloves


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Ernesto Pecoits et al.
Science (New York, N.Y.), 336(6089), 1693-1696 (2012-06-30)
Based on molecular clocks and biomarker studies, it is possible that bilaterian life emerged early in the Ediacaran, but at present, no fossils or trace fossils from this time have been reported. Here we report the discovery of the oldest
Susanne S Scherrer et al.
Dental materials : official publication of the Academy of Dental Materials, 27(2), e28-e42 (2010-11-09)
The use of a 30 μm alumina-silica coated particle sand (CoJet™ Sand, 3M Espe), has shown to enhance the adhesion of resin cements to Y-TZP. The question is whether or not sandblasting 30 μm particles does negatively affect the fatigue
Amilcar Chagas Freitas et al.
Implant dentistry, 19(6), 539-548 (2010-12-02)
The aim of this study was to evaluate the influence of different Young moduli of the ceramic crown on the distribution of tensions in the region of the abutment-crown interface by making use of 2D finite element analysis. Two representative
Wei-Qing Yang et al.
Spectrochimica acta. Part A, Molecular and biomolecular spectroscopy, 79(5), 1291-1294 (2011-06-15)
The spin-Hamiltonian parameters (g factors g∥, g⊥ and zero-field splittings b2(0), b4(0), b4(4), b6(0), b6(4)) for 4f7 ion Gd3+ at the tetragonal M4+ site of zircon-structure silicates MSiO4 (M=Zr, Hf, Th) are calculated from a diagonalization (of energy matrix) method.
Işil Sarikaya et al.
Journal of applied oral science : revista FOB, 18(1), 10-16 (2010-04-10)
The purpose of this study was to evaluate the effects of different polishing techniques on the surface roughness of dental porcelains. Fifty-five cylindirical specimens (15x2 mm) were prepared for each feldspathic (Vita VMK 95, Ceramco III) and low-fusing dental porcelain

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