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Sigma-Aldrich

Bismuth(III) oxide

purum, ≥98.0% (KT)

Synonym(s):

Dibismuth trioxide

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About This Item

Empirical Formula (Hill Notation):
Bi2O3
CAS Number:
1304-76-3
Molecular Weight:
465.96
EC Number:
215-134-7
MDL number:
MFCD00003462
UNSPSC Code:
12352303
PubChem Substance ID:
329770453
NACRES:
NA.23

grade

purum

Quality Level

200

Assay

≥98.0% (KT)

form

crystals

reaction suitability

reagent type: catalyst
core: bismuth

loss

≤0.2% loss on ignition

SMILES string

O=[Bi]O[Bi]=O

InChI

1S/2Bi.3O

InChI key

WMWLMWRWZQELOS-UHFFFAOYSA-N

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Features and Benefits

Preparation of new stabilized, oxide ion-conducting, bismuth vanadate phases by a microwave assisted method, from V2O5, Bi2O3 and other solid oxides, was reported. These ceramics show promise in solid oxide fuel cells, water-vapor electrolyzers and oxygen sensors.

Storage Class Code

13 - Non Combustible Solids

WGK

nwg

Personal Protective Equipment

dust mask type N95 (US), Eyeshields, Gloves

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Certificates of Analysis (COA)

Lot/Batch Number
BCCC2734
BCBV8465
BCBV4124
BCBT5418
BCBS0969V

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Hagit Aviv et al.
Journal of biomedical materials research. Part B, Applied biomaterials, 101(1), 131-138 (2012-10-24)
Bismuth oxide nanoparticles of 12.1 ± 3.0 nm diameter were prepared by thermal decomposition of bismuth acetate dissolved in ethylene glycol in the presence of an oxidizing agent. Functionalization and stabilization of the hydrophobic Bi(2)O(3) nanoparticles was accomplished by coating
Dirk Mansfeld et al.
Chemistry (Weinheim an der Bergstrasse, Germany), 17(52), 14805-14810 (2011-11-29)
The reaction of [Bi(22)O(26)(OSiMe(2)tBu)(14)] (1) in THF with salicylic acid gave [Bi(22)O(24)(HSal)(14)] (2) first, which was converted into [Bi(38)O(45)(HSal)(22)(OH)(2)(DMSO)(16.5)]·DMSO·H(2)O (3·DMSO·H(2)O) after dissolution and crystallization from DMSO. Single-crystal X-ray diffraction analysis and ESI mass spectrometry associated with infrared multi-photon dissociation (IRMPD)
Shuhong Xie et al.
Nanoscale, 4(2), 408-413 (2011-11-22)
Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique
V S Kopp et al.
Acta crystallographica. Section A, Foundations of crystallography, 68(Pt 1), 148-155 (2011-12-22)
X-ray diffraction from films consisting of layers with different thicknesses, structures and chemical contents is analysed. The disorder is described by probabilities for different sequences of layers. Closed analytical expressions for the diffracted X-ray intensity are obtained when the layers
L M Formosa et al.
International endodontic journal, 45(4), 326-336 (2011-11-03)
To investigate the physical properties of tricalcium silicate (TCS) with and without the addition of a radiopacifier and compare them with that of Portland cement (PC) and radiopaque PC in an mineral trioxide aggregate-like system. Tricalcium silicate, PC and radiopacified
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