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216011

Sigma-Aldrich

Ammonium fluoride

ACS reagent, ≥98.0%

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About This Item

Linear Formula:
NH4F
CAS Number:
Molecular Weight:
37.04
EC Number:
MDL number:
UNSPSC Code:
12352300
eCl@ss:
38050106
PubChem Substance ID:
NACRES:
NA.21

grade

ACS reagent

Quality Level

Assay

≥98.0%

form

crystals, granules or chunks

impurities

≤0.005% insolubles

ign. residue

≤0.01%

pH

~6 (20 °C)

anion traces

chloride (Cl-): ≤0.001%
sulfate (SO42-): ≤0.005%

cation traces

Fe: ≤5 ppm
heavy metals (as Pb): ≤5 ppm

SMILES string

N.F

InChI

1S/FH.H3N/h1H;1H3

InChI key

LDDQLRUQCUTJBB-UHFFFAOYSA-N

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Application

Employed in a new hydrothermal synthesis of complex flourides NaHoF4 and NaEuF4 these interesting compounds have the fluorite structure and are important for solid-state lasers as well as for photoluminescence and magnetic characteristics.

Pictograms

Skull and crossbones

Signal Word

Danger

Hazard Statements

Hazard Classifications

Acute Tox. 3 Dermal - Acute Tox. 3 Inhalation - Acute Tox. 3 Oral

Storage Class Code

6.1D - Non-combustible acute toxic Cat.3 / toxic hazardous materials or hazardous materials causing chronic effects

WGK

WGK 1

Flash Point(F)

does not flash

Flash Point(C)

does not flash


Certificates of Analysis (COA)

Search for Certificates of Analysis (COA) by entering the products Lot/Batch Number. Lot and Batch Numbers can be found on a product’s label following the words ‘Lot’ or ‘Batch’.

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Phase transition in ammonium fluoride.
Stevenson R.
J. Chem. Phys. , 34(1), 346-347 (1961)
Self-organized TiO2 nanotubes prepared in ammonium fluoride containing acetic acid electrolytes.
Tsuchiya H, et al.
Electrochemical Communications, 7(6), 576-580 (2005)
Xun, X. et al.
Chemistry of Materials, 9, 2966-2966 (1997)
On the Etching of Silicon by Oxidants in Ammonium Fluoride Solutions A Mechanistic Study.
Gerischer H and Lubke M.
Journal of the Electrochemical Society, 135(11), 2782-2786 (1988)
Surface analysis of the electropolishing layer on Si (111) in ammonium fluoride solution.
Lewerenz HJ, et al.
Electrochimica Acta, 45(28), 4615-4627 (2000)

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