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Merck

Effect of a confocal pinhole in two-photon microscopy.

Microscopy research and technique (1999-11-02)
R Gauderon, P B Lukins, C J Sheppard
摘要

We investigated the effect of a finite-sized confocal pinhole on the performance of nonlinear optical microscopes based on two-photon excited fluorescence and second-harmonic generation. These techniques were implemented using a modified inverted commercial confocal microscope coupled to a femtosecond Ti:sapphire laser. Both the transverse and axial resolutions are improved when the confocal pinhole is used, albeit at the expense of the signal level. Therefore, the routine use of a confocal pinhole of optimized size is recommended for two-photon microscopy wherever the fluorescence or harmonic signals are large.

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Sigma-Aldrich
四硼酸锂, ≥99.9% trace metals basis
Sigma-Aldrich
偏硼酸锂, 99.9% trace metals basis
Sigma-Aldrich
偏硼酸锂, ACS reagent, ≥98.0%
Sigma-Aldrich
四硼酸锂, ≥99.995% trace metals basis
Sigma-Aldrich
偏硼酸锂, 99.995% trace metals basis