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08729

Supelco

Silicon Standard for ICP

TraceCERT®, 1 g/L Si in nitric acid (nominal concentration)

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About This Item

UNSPSC Code:
41116107
NACRES:
NA.24

grade

certified reference material
TraceCERT®

Quality Level

product line

TraceCERT®

concentration

1 g/L Si in nitric acid (nominal concentration)

technique(s)

ICP: suitable

application(s)

industrial qc
pharmaceutical

format

single component solution

General description

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at https://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

Application

Silicon ICP standard can be used as a calibration standard in the determination of silicon concentration in organosilica materials by inductively coupled plasma optical emission spectroscopy (ICP-OES).

Analysis Note

1 g/L Si in 2% HNO3 (contains HF traces), prepared with high purity Si, HNO3, HF, and water

Other Notes

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information and example certificates please visit our ICP & AAS standards website

Legal Information

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

Pictograms

Corrosion

Signal Word

Warning

Hazard Statements

Hazard Classifications

Eye Irrit. 2 - Met. Corr. 1 - Skin Irrit. 2

Storage Class Code

8B - Non-combustible corrosive hazardous materials

WGK

nwg

Flash Point(F)

Not applicable

Flash Point(C)

Not applicable

Personal Protective Equipment

dust mask type N95 (US), Eyeshields, Gloves

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Influence of monomer connectivity, network flexibility, and hydrophobicity on the hydrothermal stability of organosilicas
Dral A, et al.
Langmuir, 33, 5527-5536 (2017)

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