US EPA Method 8270 (Appendix IX): GC Analysis of Semivolatiles on SLB^®-5ms (30 m x 0.25 mm I.D., 0.50 μm)

column

SLB-5ms, 30 m x 0.25 mm I.D., 0.50 μm (28473-U)

oven

40 °C (1 min), 12 °C/min to 250 °C, 25 °C/min to 340 °C (4.5 min)

inj. temp.

250 °C

MSD interface

340 °C

scan range

m/z = 40-450

carrier gas

helium, 1.5 mL/min constant

injection

1.0 μL, splitless (0.50 min)

liner

4 mm I.D., single taper

sample

50 ng on-column of a 62 component semivolatile standard and 8 surrogate compounds, plus 6 internal standards (at 40 ng on-column)