Skip to Content
Merck
All Photos(1)

Key Documents

30101

Sigma-Aldrich

Ammonium fluoride

puriss. p.a., ACS reagent, ≥98%

Sign Into View Organizational & Contract Pricing


About This Item

Linear Formula:
NH4F
CAS Number:
Molecular Weight:
37.04
EC Number:
MDL number:
UNSPSC Code:
12352302
eCl@ss:
38050106
PubChem Substance ID:

grade

ACS reagent
puriss. p.a.

Assay

≥98%

form

solid

impurities

≤0.1% hexafluorosilicate (as SiF6)
≤1% ammonium hydrogen difluoride (NH4HF2)

ign. residue

≤0.005% (as SO4)

anion traces

chloride (Cl-): ≤5 mg/kg
sulfate (SO42-): ≤50 mg/kg

cation traces

Cd: ≤5 mg/kg
Cu: ≤5 mg/kg
Fe: ≤5 mg/kg
K: ≤20 mg/kg
Na: ≤20 mg/kg
Pb: ≤5 mg/kg
Zn: ≤5 mg/kg

SMILES string

N.F

InChI

1S/FH.H3N/h1H;1H3

InChI key

LDDQLRUQCUTJBB-UHFFFAOYSA-N

Looking for similar products? Visit Product Comparison Guide

Pictograms

Skull and crossbones

Signal Word

Danger

Hazard Statements

Hazard Classifications

Acute Tox. 3 Dermal - Acute Tox. 3 Inhalation - Acute Tox. 3 Oral

Storage Class Code

6.1D - Non-combustible acute toxic Cat.3 / toxic hazardous materials or hazardous materials causing chronic effects

WGK

WGK 1

Flash Point(F)

does not flash

Flash Point(C)

does not flash


Choose from one of the most recent versions:

Certificates of Analysis (COA)

Lot/Batch Number

Sorry, we don't have COAs for this product available online at this time.

If you need assistance, please contact Customer Support.

Already Own This Product?

Find documentation for the products that you have recently purchased in the Document Library.

Visit the Document Library

Etching processing of Si (111) and Si (100) surfaces in an ammonium fluoride solution investigated by in situ ATR-IR.
Nakamura M, et al.
Electrochimica Acta, 41(5), 681-686 (1996)
Jae Hoon Bong et al.
Nanoscale, 6(15), 8503-8508 (2014-06-21)
We report a post-synthetic n-doping method for chemical-vapor-deposition (CVD) grown graphene using wet chemical processing. An ammonium fluoride solution was found effective in converting pristine hole doping into electron doping in addition to the mobility improvement of charge carriers. We
On the Etching of Silicon by Oxidants in Ammonium Fluoride Solutions A Mechanistic Study.
Gerischer H and Lubke M.
Journal of the Electrochemical Society, 135(11), 2782-2786 (1988)
Surface analysis of the electropolishing layer on Si (111) in ammonium fluoride solution.
Lewerenz HJ, et al.
Electrochimica Acta, 45(28), 4615-4627 (2000)
Yuntao Li et al.
Journal of hazardous materials, 172(2-3), 635-640 (2009-08-12)
A F-doped vanadia/titania catalyst has been developed by partly substituting the lattice oxygen of the catalyst with fluorine, using NH(4)F as a precursor. The aim of this novel design was to promote the activity of a catalyst with low vanadia

Our team of scientists has experience in all areas of research including Life Science, Material Science, Chemical Synthesis, Chromatography, Analytical and many others.

Contact Technical Service