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441783

Sigma-Aldrich

Pentaerythritol tetrakis(3,5-di-tert-butyl-4-hydroxyhydrocinnamate)

98%

Synonym(s):

Antioxidant 1010, Irganox 1010, Pentaerythritol tetrakis(3-(3,5-di-tert-butyl-4-hydroxyphenyl)propionate)

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About This Item

Linear Formula:
[HOC6H2[C(CH3)3]2CH2CH2CO2CH2]4C
CAS Number:
6683-19-8
Molecular Weight:
1177.63
EC Number:
229-722-6
MDL number:
MFCD00059345
UNSPSC Code:
12162002
PubChem Substance ID:
24867702
NACRES:
NA.23

Assay

98%

mp

115-118 °C (dec.) (lit.)

SMILES string

CC(C)(C)c1cc(CCC(=O)OCC(COC(=O)CCc2cc(c(O)c(c2)C(C)(C)C)C(C)(C)C)(COC(=O)CCc3cc(c(O)c(c3)C(C)(C)C)C(C)(C)C)COC(=O)CCc4cc(c(O)c(c4)C(C)(C)C)C(C)(C)C)cc(c1O)C(C)(C)C

InChI

1S/C73H108O12/c1-65(2,3)49-33-45(34-50(61(49)78)66(4,5)6)25-29-57(74)82-41-73(42-83-58(75)30-26-46-35-51(67(7,8)9)62(79)52(36-46)68(10,11)12,43-84-59(76)31-27-47-37-53(69(13,14)15)63(80)54(38-47)70(16,17)18)44-85-60(77)32-28-48-39-55(71(19,20)21)64(81)56(40-48)72(22,23)24/h33-40,78-81H,25-32,41-44H2,1-24H3

InChI key

BGYHLZZASRKEJE-UHFFFAOYSA-N

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General description

Pentaerythritol tetrakis(3,5-di-tert-butyl-4-hydroxyhydrocinnamate) (PT) is a sterically hindered phenolic antioxidant and a heat stabilizer mainly used to enhance the oxidative resistance and protection against the toxicity of solvents. It has a glass transition temperature of 50 0C and can be annealed at room temperature.

Application

PT can be used as an additive to protect biaxially-oriented propylene (BOPP) capacitor film from thermal oxidation on UV exposure. It can also be used as a standard material to study the gas-cluster ion sputtering (GCIS) using X-ray photoelectron microscopy (XPS) and Atomic force microscopy (AFM).

Storage Class Code

11 - Combustible Solids

WGK

nwg

Flash Point(F)

Not applicable

Flash Point(C)

Not applicable

Personal Protective Equipment

dust mask type N95 (US), Eyeshields, Gloves

Certificates of Analysis (COA)

Search for Certificates of Analysis (COA) by entering the products Lot/Batch Number. Lot and Batch Numbers can be found on a product’s label following the words ‘Lot’ or ‘Batch’.

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Upcycling of polypropylene?The influence of polyethylene impurities.
Kamleitner F, et al.
Polym. Eng. Sci., 57(12), 1374-1381 (2017)
Gas-cluster ion sputtering: Effect on organic layer morphology.
Goodwin CM, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, And Films, 36(5), 051507-051507 (2018)
Dan Mao et al.
Analytical chemistry, 83(16), 6410-6417 (2011-07-13)
Time-of-flight secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by a 40-keV C(60)(+) cluster ion beam on an organic film of Irganox 1010 doped with Irganox 3114 delta layers. From an examination
J L S Lee et al.
Analytical chemistry, 82(1), 98-105 (2009-12-05)
Cluster ion beams have revolutionized the analysis of organic surfaces in time-of-flight secondary ion mass spectrometry and opened up new capabilities for organic depth profiling. Much effort has been devoted to understanding the capabilities and improving the performance of SF(5)(+)
John S Fletcher et al.
Analytical chemistry, 78(6), 1827-1831 (2006-03-16)
C60 has been shown to give increased sputter yields and, hence, secondary ions when used as a primary particle in SIMS analysis. In addition, for many samples, there is also a reduction in damage accumulation following continued bombardment with the
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