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Safety Information

NIST2137

Boron implant in silicon standard for calibration of concentration in a depth profile

NIST® SRM® 2137

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About This Item

UNSPSC Code:
12352200
NACRES:
NA.24

grade

certified reference material

packaging

pkg of each

manufacturer/tradename

NIST®

application(s)

semiconductor

format

matrix material

General description

This Standard Reference Material (SRM) is intended for use in calibrating the secondary ion response to minor and trace levels of boron in a silicon matrix by the analytical technique of secondary ion mass spectrometry (SIMS). A unit of SRM 2137 consists of a single crystal silicon substrate with a surface rendered disordered by silicon ion implantation. For more information, please refer to the SDS and COA.

SRM 2137_cert

SRM 2137_SDS

Other Notes

Example analytes are listed below as a reference. Please download a current certificate at nist.gov/SRM for current analytes and certified values.
Boron (10B)

See certificate for values and more details at nist.gov/SRM.

Legal Information

NIST is a registered trademark of National Institute of Standards and Technology
SRM is a registered trademark of National Institute of Standards and Technology

Storage Class Code

13 - Non Combustible Solids

WGK

WGK 3

Flash Point(F)

Not applicable

Flash Point(C)

Not applicable

Regulatory Listings

Regulatory Listings are mainly provided for chemical products. Only limited information can be provided here for non-chemical products. No entry means none of the components are listed. It is the user’s obligation to ensure the safe and legal use of the product.

ISHL Indicated Name

Substances Subject to be Indicated Names

ISHL Notified Names

Substances Subject to be Notified Names

JAN Code

NIST2137:

Choose from one of the most recent versions:

Certificates of Analysis (COA)

Lot/Batch Number

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