NIST2000

Calibration standard for high-resolution X-ray diffraction

NIST^® SRM^® 2000

• Código UNSPSC: 41116107
• NACRES: NA.24

Propiedades

• grado: certified reference material
• Nivel de calidad: 100
• formulario: solid
• envase: pkg of 1 block
• fabricante / nombre comercial: NIST^®
• técnicas: diffraction/scattering: suitable
• aplicaciones: general analytical

Descripción

Descripción general

This Standard Reference Material (SRM) provides the high-resolution X-ray diffraction (HRXRD) community with International System of Units (SI) [1] traceable Si (220) d-spacing in transmission, surface-to-crystal-plane wafer miscut, and surface-to-Si (004) Bragg angle in reflection for our reference wavelength. A unit of SRM 2000 consists of25 mm × 25 mm × 0.725 mm double-polished (100)-oriented, single-crystal Si specimens with a nominal 50 nm Si0.85Ge0.15 epitaxial layer and 25 nm Si cap. These certified values can be used to calibrate HRXRD instrumentation. For more information, please refer to the SDS and COA.

SRM 2000_cert

SRM 2000_SDS

Otras notas

Please download a current certificate at nist.gov/SRM for current analytes and certified values.

Información legal

NIST is a registered trademark of National Institute of Standards and Technology

SRM is a registered trademark of National Institute of Standards and Technology

Información de seguridad

• Código de clase de almacenamiento: 10 - Combustible liquids
• Clase de riesgo para el agua (WGK): WGK 3
• Punto de inflamabilidad (°F): Not applicable
• Punto de inflamabilidad (°C): Not applicable