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[Raman spectra study of tellurium dioxide (TeO2) crystal].

Guang pu xue yu guang pu fen xi = Guang pu (2003-09-05)
Xiao-jing Liu, Huai-li Qiu, Ai-hua Wang, Shao-tang Yin, Jing-lin You, Guo-chang Jiang
ABSTRACT

The room temperature and high temperature Raman spectra of solid/melt growth boundary layers of TeO2 grown from melt were measured by high-temperature laser-micro-Raman spectrum. By analyzing, vibrational modes of the room temperature Raman spectra peaks of TeO2 crystal from band 200-800 cm-1 were confirmed, the expansion and frequency shift of each peak of the high temperature Raman spectra were interpreted and the possible structure group of the melt was proposed. So, certain foundation for studying the growth theory of functional crystal materials was provided.

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Sigma-Aldrich
Biossido di tellurio, ≥99%
Sigma-Aldrich
Biossido di tellurio, 99.995% trace metals basis
Sigma-Aldrich
Biossido di tellurio, ≥97.0%