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Silicon Standard for ICP

TraceCERT®, 1 g/L Si in NaOH (nominal concentration)

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About This Item

Codice UNSPSC:
41116107
NACRES:
NA.24

Grado

certified reference material
TraceCERT®

Livello qualitativo

Nome Commerciale

TraceCERT®

Concentrazione

1 g/L Si in NaOH (nominal concentration)

tecniche

ICP: suitable

applicazioni

industrial qc
pharmaceutical

Formato

single component solution

Descrizione generale

This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.

Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.

Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.

Applicazioni

50 ng/g of Silicon standard may be used to improve maximum signal-to-background intensity ratios (SBR) during High-resolution inductively coupled plasma mass spectrometry (HR-ICP-MS).

Risultati analitici

1 g/L Si in 2% sodium hydroxide, prepared with high purity Si, NaOH and water

Altre note

For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website

Note legali

TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany

Pittogrammi

Corrosion

Avvertenze

Danger

Indicazioni di pericolo

Classi di pericolo

Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B

Codice della classe di stoccaggio

8B - Non-combustible corrosive hazardous materials

Classe di pericolosità dell'acqua (WGK)

nwg

Punto d’infiammabilità (°F)

Not applicable

Punto d’infiammabilità (°C)

Not applicable

Dispositivi di protezione individuale

Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter


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Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS.
Pohl, Pawel, et al.
Journal of Analytical Atomic Spectrometry, 25.9, 1461-1466 (2010)

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