204994
Zirconium(IV) oxide
99.99% trace metals basis (purity excludes ~2% HfO2)
Synonym(s):
Zirconia
Sign Into View Organizational & Contract Pricing
All Photos(1)
About This Item
Recommended Products
Quality Level
Assay
99.99% trace metals basis (purity excludes ~2% HfO2)
form
powder
reaction suitability
reagent type: catalyst
core: zirconium
bp
5000 °C (lit.)
mp
2700 °C (lit.)
density
5.89 g/mL at 25 °C (lit.)
application(s)
battery manufacturing
SMILES string
O=[Zr]=O
InChI
1S/2O.Zr
InChI key
MCMNRKCIXSYSNV-UHFFFAOYSA-N
Looking for similar products? Visit Product Comparison Guide
Related Categories
Storage Class Code
11 - Combustible Solids
WGK
nwg
Flash Point(F)
Not applicable
Flash Point(C)
Not applicable
Personal Protective Equipment
dust mask type N95 (US), Eyeshields, Gloves
Choose from one of the most recent versions:
Already Own This Product?
Find documentation for the products that you have recently purchased in the Document Library.
Acta biomaterialia, 9(9), 8394-8402 (2013-05-21)
Effective and reliable clinical uses of dental ceramics necessitate an insightful analysis of the fracture behaviour under critical conditions. To better understand failure characteristics of porcelain veneered to zirconia core ceramic structures, thermally induced cracking during the cooling phase of
mBio, 6(3), e00536-e00536 (2015-06-04)
A rapid and global emergence of azole resistance has been observed in the pathogenic fungus Aspergillus fumigatus over the past decade. The dominant resistance mechanism appears to be of environmental origin and involves mutations in the cyp51A gene, which encodes
The Journal of general virology, 95(Pt 3), 557-570 (2013-12-04)
A novel virus was detected in a sample collected from a Swedish moose (Alces alces). The virus was suggested as a member of the Hepeviridae family, although it was found to be highly divergent from the known four genotypes (gt1-4)
Physical chemistry chemical physics : PCCP, 17(28), 18613-18620 (2015-06-30)
The crystallization kinetics of amorphous 3 and 8 mol% yttria stabilized zirconia (3YSZ and 8YSZ) thin films grown by pulsed laser deposition (PLD), spray pyrolysis and dc-magnetron sputtering are explored. The deposited films were heat treated up to 1000 °C
Journal of microscopy, 259(3), 237-256 (2015-05-01)
Electron backscatter diffraction (EBSD) on ice is a decade old. We have built upon previous work to select and develop methods of sample preparation and analysis that give >90% success rate in obtaining high-quality EBSD maps, for the whole surface
Our team of scientists has experience in all areas of research including Life Science, Material Science, Chemical Synthesis, Chromatography, Analytical and many others.
Contact Technical Service