- Radiation damage due to knock-on processes on carbon foils cooled to liquid helium temperature.
Radiation damage due to knock-on processes on carbon foils cooled to liquid helium temperature.
Ultramicroscopy (1978-01-01)
I Dietrich, F Fox, H G Heide, E Knapek, R Weyl
PMID695132
ABSTRACT
Radiation damage on a holey carbon foil was investigated in an electron microscope with a superconducting lens system, where the temperature of the specimen and its environment initially was 4 K. Due to an electron dose of 2 X 10(4) As/cm2 the diameter of a hole increased 5 nm. Rough calculations show that this increase can be ascribed to knock-on processes. Estimates of the rise in specimen temperature during the irradiation are given.