US EPA Method 8270: GC Analysis of Semivolatiles on SLB^®-5ms (20 m x 0.18 mm I.D., 0.36 μm), 28 °C/min Oven Ramp, Fast GC Analysis

column

SLB-5ms, 20 m × 0.18 mm I.D., 0.36 μm (28576-U)

oven

50 °C (0.50 min), 28 °C/min to 250 °C, 35 °C/min to 340 °C (5 min)

inj. temp.

250 °C

MSD interface

340 °C

scan range

m/z = 40-450

carrier gas

helium, 1.4 mL/min constant

injection

0.50 μL, reduced pressure to 20 psi at injection (0.1 min) (splitter open at 0.75 min)

liner

2 mm I.D., straight

sample

80 component semivolatile standard at 50 ppm, plus 6 internal standards (at 40 ppm) in methylene chloride