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Low temperature growth of gallium oxide thin films via plasma enhanced atomic layer deposition.

Dalton transactions (Cambridge, England : 2003) (2017-11-22)
Richard O'Donoghue, Julian Rechmann, Morteza Aghaee, Detlef Rogalla, Hans-Werner Becker, Mariadriana Creatore, Andreas Dirk Wieck, Anjana Devi
RESUMEN

Herein we describe an efficient low temperature (60-160 °C) plasma enhanced atomic layer deposition (PEALD) process for gallium oxide (Ga

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Lithium dimethylamide, 95%