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  • Fundamentals of MOF Thin Film Growth via Liquid-Phase Epitaxy: Investigating the Initiation of Deposition and the Influence of Temperature.

Fundamentals of MOF Thin Film Growth via Liquid-Phase Epitaxy: Investigating the Initiation of Deposition and the Influence of Temperature.

Langmuir : the ACS journal of surfaces and colloids (2015-05-29)
Monica L Ohnsorg, Christopher K Beaudoin, Mary E Anderson
RESUMEN

Thin films can integrate the versatility and great potential found in the emerging field of metal-organic frameworks directly into device architectures. For fabrication of smart interfaces containing surface-anchored metal-organic frameworks, it is important to understand how the foundational layers form to create the interface between the underlying substrate and porous framework. Herein, the formation and morphology of the first ten cycles of film deposition are investigated for the well-studied HKUST-1 system. Effects of processing variables, such as deposition temperature and substrate quality, are studied. Sequences of scanning probe microscopy images collected after cycles of alternating solution-phase deposition reveal the formation of a discontinuous surface with nucleating and growing crystallites consistent with a Volmer-Weber growth mechanism. Quantitative image analysis determines surface roughness and surface coverage as a function of deposition cycles, producing insight regarding growth and structure of foundational film layers. For carboxylic acid terminated self-assembled monolayers on gold, preferred crystal orientation is influenced by deposition temperature with crystal growth along [100] observed at 25 °C and [111] favored at 50 °C. This difference in crystal orientation results in reduced surface roughness and increased surface coverage at 50 °C. To properly fabricate and fully determine the potential of this material for industrial applications, fundamental understanding of film formation is crucial.

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Alcohol etílico puro, 200 proof, anhydrous, ≥99.5%
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Trimesic acid, 95%
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Trimetilaluminio solution, 2.0 M in toluene
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Alcohol etílico puro, 190 proof, ACS spectrophotometric grade, 95.0%
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Trimethylaluminum, 97%
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Alcohol etílico puro, 190 proof, meets USP testing specifications
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Trimetilaluminio solution, 2.0 M in hexanes
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Copper(II) acetate hydrate, 98%
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Trimethylaluminum, packaged for use in deposition systems
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16-Mercaptohexadecanoic acid, 90%
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Ethanol solution, 10 % (v/v) in H2O, analytical standard
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Copper(II) acetate monohydrate, 99.99% trace metals basis
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Etanol, ≥99.5%, suitable for HPLC
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Etanol, JIS special grade, 94.8-95.8%
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Etanol, ≥99.5%
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16-Mercaptohexadecanoic acid, 98%
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Etanol, JIS first grade, 94.8-95.8%
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Etanol, ≥99.5%, SAJ super special grade
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Etanol, JIS 300, ≥99.5%, for residue analysis
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Etanol, JIS 1000, ≥99.5%, for residue analysis
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Copper(II) acetate monohydrate, SAJ first grade, ≥98.0%