Accurate macromolecular structures using minimal measurements from X-ray free-electron lasers.

Accurate macromolecular structures using minimal measurements from X-ray free-electron lasers.

Nature methods (2014-03-19)

Johan Hattne, Nathaniel Echols, Rosalie Tran, Jan Kern, Richard J Gildea, Aaron S Brewster, Roberto Alonso-Mori, Carina Glöckner, Julia Hellmich, Hartawan Laksmono, Raymond G Sierra, Benedikt Lassalle-Kaiser, Alyssa Lampe, Guangye Han, Sheraz Gul, Dörte DiFiore, Despina Milathianaki, Alan R Fry, Alan Miahnahri, William E White, Donald W Schafer, M Marvin Seibert, Jason E Koglin, Dimosthenis Sokaras, Tsu-Chien Weng, Jonas Sellberg, Matthew J Latimer, Pieter Glatzel, Petrus H Zwart, Ralf W Grosse-Kunstleve, Michael J Bogan, Marc Messerschmidt, Garth J Williams, Sébastien Boutet, Johannes Messinger, Athina Zouni, Junko Yano, Uwe Bergmann, Vittal K Yachandra, Paul D Adams, Nicholas K Sauter

PMID24633409

RESUMEN

X-ray free-electron laser (XFEL) sources enable the use of crystallography to solve three-dimensional macromolecular structures under native conditions and without radiation damage. Results to date, however, have been limited by the challenge of deriving accurate Bragg intensities from a heterogeneous population of microcrystals, while at the same time modeling the X-ray spectrum and detector geometry. Here we present a computational approach designed to extract meaningful high-resolution signals from fewer diffraction measurements.

MATERIALES

Referencia del producto

Marca

Descripción del producto

209988

Sigma-Aldrich

Cinc, dust, <10 μm, ≥98%

324930

Sigma-Aldrich

Cinc, powder, <150 μm, 99.995% trace metals basis

578002

Sigma-Aldrich