204994
Zirconium(IV) oxide
99.99% trace metals basis (purity excludes ~2% HfO2)
Synonym(s):
Zirconia
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About This Item
Linear Formula:
ZrO2
CAS Number:
Molecular Weight:
123.22
EC Number:
MDL number:
UNSPSC Code:
12352303
PubChem Substance ID:
NACRES:
NA.23
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Quality Level
assay
99.99% trace metals basis (purity excludes ~2% HfO2)
form
powder
reaction suitability
reagent type: catalyst
core: zirconium
bp
5000 °C (lit.)
mp
2700 °C (lit.)
density
5.89 g/mL at 25 °C (lit.)
application(s)
battery manufacturing
SMILES string
O=[Zr]=O
InChI
1S/2O.Zr
InChI key
MCMNRKCIXSYSNV-UHFFFAOYSA-N
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Related Categories
Storage Class
11 - Combustible Solids
wgk_germany
nwg
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
dust mask type N95 (US), Eyeshields, Gloves
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Zhongpu Zhang et al.
Acta biomaterialia, 9(9), 8394-8402 (2013-05-21)
Effective and reliable clinical uses of dental ceramics necessitate an insightful analysis of the fracture behaviour under critical conditions. To better understand failure characteristics of porcelain veneered to zirconia core ceramic structures, thermally induced cracking during the cooling phase of
Alireza Abdolrasouli et al.
mBio, 6(3), e00536-e00536 (2015-06-04)
A rapid and global emergence of azole resistance has been observed in the pathogenic fungus Aspergillus fumigatus over the past decade. The dominant resistance mechanism appears to be of environmental origin and involves mutations in the cyp51A gene, which encodes
Jay Lin et al.
The Journal of general virology, 95(Pt 3), 557-570 (2013-12-04)
A novel virus was detected in a sample collected from a Swedish moose (Alces alces). The virus was suggested as a member of the Hepeviridae family, although it was found to be highly divergent from the known four genotypes (gt1-4)
D Stender et al.
Physical chemistry chemical physics : PCCP, 17(28), 18613-18620 (2015-06-30)
The crystallization kinetics of amorphous 3 and 8 mol% yttria stabilized zirconia (3YSZ and 8YSZ) thin films grown by pulsed laser deposition (PLD), spray pyrolysis and dc-magnetron sputtering are explored. The deposited films were heat treated up to 1000 °C
D J Prior et al.
Journal of microscopy, 259(3), 237-256 (2015-05-01)
Electron backscatter diffraction (EBSD) on ice is a decade old. We have built upon previous work to select and develop methods of sample preparation and analysis that give >90% success rate in obtaining high-quality EBSD maps, for the whole surface
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